Imaging Performance Testing of Domestic Amorphous Silicon Flat Panel Detectors under Different Radiation Excitations

Imaging performance of amorphous silicon flat panel detectors (model 3025ZF) with CsI and GOS scintillator materials under continuous-spectrum X-ray, pulsed X-ray, and γ-ray excitations were evaluated in this study. The experimental results show that under both continuous-spectrum X-ray and pulsed X-ray excitations, both detectors meet the Class A image resolution and sensitivity requirements of the NB/T 47013.11-2023 standard. Among them, the CsI detector demonstrates superior performance in resolution and sensitivity, while the GOS detector excels in signal-to-noise ratio. However, under γ-ray excitation, the imaging quality of both detectors significantly declines, with both image sensitivity and resolution failing to meet the standard requirements, primarily due to the high energy and larger focal spot size of γ-rays. The research results provide experimental evidence for the selection of DR system detectors and offer references for their applicability in different application scenarios.